Vertical-cavity surface-emitting laser (VCSEL)-based parallel optical interconnects are becoming vital components of communications systems for which short distance (less than 300 meters) and high ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...

Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

In today’s world, so-called “high-performance, sustainable” facilities are a dime a dozen. But many of these buildings rely on overly complex mechanical systems to carry out their mission. While these ...

Keithley Instruments has announced the S510, a high-channel-count, turnkey semiconductor reliability test system for use in lifetime modeling of advanced ULSI CMOS processes at the 65-nm node and ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...