The number of corners that need to be checked is exploding at 7nm and below, fueled by everything from temperature and voltage to changes in metal. Lowering risk and increasing predictability of an ...
At nanometer technologies, variability is rapidly becoming one of the leading causes for chip failures and delayed schedules. However, there is significant confusion about the term “variability” in ...
A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...
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